Use Cases

Semiconductors

Quantum-Ready Simulation for Next-Generation Chip Design

As semiconductor technology pushes below 3nm nodes, designers face growing challenges in accuracy, speed, and scalability of simulations. From power integrity to thermal effects and electromigration, these problems rely on complex PDEs that quickly exceed classical computational resources. 

With ColibriTD’s hybrid quantum-classical platform QUICK, semiconductor engineers can accelerate multiphysics simulations, detect anomalies early, and optimize chip design, preparing for quantum-enhanced semiconductor modeling.
Learn more about our solution QUICK

1.
Early Anomaly Detection in Microchips

Traditional IR drop analysis struggles to balance accuracy, speed, and scalability. Full-chip simulations can take days to weeks, scaling cubically with circuit size, while sometimes missing worst-case voltage scenarios, a problem that worsens as transistors shrink.

H-DES simulates complex multi-physics phenomena at the nanoscale using a hybrid quantum-classical approach, enabling early detection of voltage and reliability anomalies while keeping classical methods for overall analysis.

Impact

Gain time

Faster full-chip reliability     simulations

Improve detection

Improved detection of worst-case scenarios

Improve design

Enhanced confidence in design     correctness and yield

2.
Thermal and Electromigration Modeling

As transistor densities increase, localized heating and current crowding create thermal hotspots and electromigration risks, threatening performance and lifetime. 

H-DES models coupled thermal, electrical, and material stress phenomena, predicting hotspots and material degradation across the chip.

Impact

Improve accuracy

Accurate identification of     thermal and stress bottlenecks

Optimize design

Optimized layout and     interconnect design

Reduce risk

Reduced risk of premature     failures and costly redesigns

3.
Advanced Power and Signal Integrity Analysis

High-frequency circuits, multi-core processors, and complex IC architectures require precise power and signal integrity analysis under dynamic conditions. Classical methods struggle to simulate large-scale interactions quickly.

H-DES solves large-scale PDEs for voltage, current, and signal propagation, enabling rapid evaluation of power integrity, IR drop, and noise margins across the entire chip.

Impact

Gain time

Faster verification of power     delivery networks

Improve accuracy

Improved accuracy for signal     integrity and timing analysis

Improve performance

Enhanced chip performance and     reliability